complex index of refraction

基本解释

The complex index of refraction, complex dielectric constant and thickness of nanofilm at different wavelength were all measured by ellipsometer.
用椭圆偏振仪测试不同波长下的复折射率和复介电常数及纳米膜的厚度；
In the study of radiation characteristics of particles, computing the particulate optical constants (the complex index of refraction) is a basic issue and occupies a key position.
在粒子辐射特性的研究中，粒子的光学常数即复折射率的求解问题占有基础性的关键地位。
Comparing with other ways to obtain the complex refraction index of infrared absorbing thin film, such as by elliptical polarization spectrometer, this method is effective and accurate.
实践证明，较之其它计算复折射率的方法，如椭偏谱测量法，本方法是有效和准确的。